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FLIR Systems, headquartered in Wilsonville, Oregon, USA, has launched its FLIR A6750sc SLS thermal imaging camera range for the Non-Destructive Testing (NDT) of advanced materials. The new camera range features lock-in, transient, and pulse capabilities for NDT, as well as for stress mapping during materials testing.
NDT is widely used to evaluate the properties of a material, component, or system without causing damage. Thermal imaging cameras can detect internal defects through target excitation and the observation of thermal differences on a target’s surface, and can be used for the detection of defects and points of failure in composites, solar cells, bridges and electronics.
The FLIR A6750sc SLS incorporates a cooled Strained Layer Superlattice detector that is said to operate in the 7.5–10.5 µm waveband and produce 640 x 512 px thermal imagery. It is capable of detecting temperature differences smaller than 20 mK (typically 18 mK). Th company’s proprietary ‘lock-in’ process is said to make it possible to detect temperature differences as small as 1 mK.
The FLIR A6750sc SLS uses a standard GigE Vision® interface to transmit full dynamic range digital video and GenICam for camera control. Additional interfaces include a BNC analog video output. The camera is designed to work seamlessly with FLIR’s ResearchIR Max software to enables intuitive viewing, recording and advanced processing of the thermal data provided. A Software Developers Kit is also optionally available.[/vc_column_text][/vc_column][/vc_row]